A graphic approach to the analysis of a large X-ray microanalysis dataset obtained via SEM–EDS

Abstract

A graphical method for phase analysis of advanced materials by EDS–SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X-ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations.

A graphic approach to the analysis of a large X-ray microanalysis datasets is proposed. The method allow for fast identification of phase composition of material and finding a small secondary phase particles against a background of the matrix phase.

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